Molecular scale imaging with a smooth superlens

Recent theory has suggested that a thin negative index film should function as a “superlens”, providing image detail with resolution beyond the diffraction limit—a limitation to which all positive index optics are subject. It has been demonstrated experimentally that a silver superlens allows resolving features well below the working wavelength. Resolution as high as 60 nanometer (λ/6) half-pitch has been achieved.

            In this project, we explore the possibility of further refining the image resolution using a multilayer ultra-smooth superlens. Using a transfer matrix scheme, our numerical calculations show an ultimate imaging resolution of λ/28 (working wavelength of 380nm). This is made possible using alternating stacks of metal and dielectric layers to enhance a broad spectrum of evanescent waves via surface plasmon modes. Preliminary experiments are ongoing to demonstrate the molecular scale imaging resolution. The development of potential low-loss and high resolution superlens opens the door to exciting applications in nanoscale optical metrology and nanomanufacturing.